P. Jonnard: search on Z-Library

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1

Analysis of periodic Mo/Si multilayers: Influence of the Mo thickness

H. Maury, J.-M. André, K. Le Guen, N. Mahne, A. Giglia, S. Nannarone, F. Bridou, F. Delmotte, P. Jonnard

Journal:

Surface Science

Year:

2009

Language:

english

File:

PDF, 483 KB

english, 2009

2

A new nitroprusside color reaction for bisulfite-binding substances

Raymond Jonnard, Marvin R. Thompson

Journal:

Journal of Pharmaceutical Sciences

Year:

1945

Language:

english

File:

PDF, 278 KB

english, 1945

3

Diffusion processes in NiTi/Si, NiTi/SiO2 and NiTi/Si3N4 systems under annealing

I Jarrige, P Holliger, P Jonnard

Journal:

Thin Solid Films

Year:

2004

Language:

english

File:

PDF, 812 KB

english, 2004

4

Structural changes induced by thermal annealing in Cr/C multilayers

Tu, Yuchun, Zhu, Jingtao, Li, Haochuan, Jonnard, Philippe, Le Guen, Karine, André, Jean-Michel, Chen, Hong, Wang, Zhanshan

Journal:

Applied Surface Science

Year:

2014

Language:

english

File:

PDF, 524 KB

english, 2014

5

Thermal and temporal stability of V/Sc multilayer mirror for the soft X-ray water window region

Yi, Qiang, Huang, Qiushi, Zhang, Jinshuai, Wang, Xiangmei, Qi, Runze, Zhang, Zhong, Xu, Rongkun, Peng, Taiping, Jonnard, Philippe, Giglia, Angelo, Wang, Zhanshan

Journal:

Year:

2017

Language:

english

File:

PDF, 1.34 MB

english, 2017

6

Electronic structure of wurtzite and zinc-blende AlN

P. Jonnard, N. Capron, F. Semond, J. Massies, E. Martinez-Guerrero, H. Mariette

Journal:

The European Physical Journal B / Condensed Matter and Complex Systems

Year:

2004

Language:

english

File:

PDF, 520 KB

english, 2004

7

Study of the Interface between Polyacrylonitrile Thin Films and a Nickel Cathode: Ni 3d States Analysed by EXES

Jonnard, Philippe, Vergand, Fran�oise, Staub, Pierre-Fran�ois, Bonnelle, Christiane, Deniau, Guy, Bureau, Christophe, L�cayon, G�rard

Journal:

Surface and Interface Analysis

Year:

1996

Language:

english

File:

PDF, 603 KB

english, 1996

8

Interfacial properties and characterization of Sc/Si multilayers

T.N. Shendruk, A. Moewes, E.Z. Kurmaev, P. Ochin, H. Maury, J.-M. André, K. Le Guen, P. Jonnard

Journal:

Thin Solid Films

Year:

2010

Language:

english

File:

PDF, 453 KB

english, 2010

9

Effect of argon etching on alumina surfaces and on Pt/alumina interfaces

P. Jonnard, P. Kayser

Journal:

Applied Surface Science

Year:

2001

Language:

english

File:

PDF, 145 KB

english, 2001

10

Kossel diffraction observed with X-ray color camera during PIXE of nano-scale periodic multilayer

Wu, Meiyi, Le Guen, Karine, André, Jean-Michel, Jonnard, Philippe, Vickridge, Ian, Schmaus, Didier, Briand, Emrick, Walter, Philippe, Huang, Qiushi, Wang, Zhanshan

Journal:

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms

Year:

2018

Language:

english

File:

PDF, 1.36 MB

english, 2018

11

Granular Adsorbents for Sugar Refining - Some Physical Properties of Bone Char and Synthad

Barrett, Elliott P., Jonnard, Aimison, Messmer, J. H.

Journal:

Industrial & Engineering Chemistry

Year:

1953

Language:

english

File:

PDF, 386 KB

english, 1953

12

transition metals

Jonnard, P., Jarrige, I., Bonnelle, C.

Journal:

Physical Review B

Year:

2005

Language:

english

File:

PDF, 164 KB

english, 2005

13

Modulation of x-ray line intensity emitted by a periodic structure under electron excitation

Jonnard, P., Ândré, J.-M., Bonnelle, C., Bridou, F., Pardo, B.

Journal:

Applied Physics Letters

Year:

2002

Language:

english

File:

PDF, 223 KB

english, 2002

14

Physico-chemical state of the silicon atoms in the HfO2/SiO2/Si system

P. Jonnard, I. Jarrige, O. Renault, J.-F. Damlencourt, F. Martin

Journal:

Surface Science

Year:

2004

Language:

english

File:

PDF, 295 KB

english, 2004

15

Electronic structure of Ni-Al interfaces

Bonnelle, C, Cyrot-Lackmann, F, Jonnard, P, Julien, J P, Mayou, D, Vergand, F

Journal:

Physica Scripta

Year:

1988

Language:

english

File:

PDF, 327 KB

english, 1988

16

Ultra-short and ultra-intense X-ray free-electron laser single pulse in one-dimensional photonic crystals

André, Jean-Michel, Jonnard, Philippe

Journal:

Journal of Synchrotron Radiation

Year:

2017

Language:

english

File:

PDF, 749 KB

english, 2017

17

Development and Interfacial Characterization of Co/Mg Periodic Multilayers for the EUV Range

Le Guen, K., Hu, M.-H., André, J.-M., Jonnard, P., Zhou, S. K., Li, H. Ch., Zhu, J. T., Wang, Z. S., Meny, C.

Journal:

The Journal of Physical Chemistry C

Year:

2010

Language:

english

File:

PDF, 1.63 MB

english, 2010

18

Spontaneous soft x-ray fluorescence from a superlattice under Kossel diffraction conditions

Jonnard, P, Yuan, Y-Y, Le Guen, K, André, J-M, Zhu, J-T, Wang, Z-S, Bridou, F

Journal:

Journal of Physics B Atomic Molecular and Optical Physics

Year:

2014

Language:

english

File:

PDF, 379 KB

english, 2014

19

Aluminium valence and core excitonic states in GaAs-Ga0.7Al0.3As systems

F. Vergand, P. Jonnard, M. Kefi, C. Bonnelle, C. Deparis, J. Massies

Year:

1993

Language:

english

File:

PDF, 490 KB

english, 1993

20

Electron energy distributions at AuPd/alumina interfaces

M. Kefi, P. Jonnard, F. Vergand, A. Amamou, C. Bonnelle

Year:

1994

Language:

english

File:

PDF, 470 KB

english, 1994

21

[IEEE 2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena - Victoria, BC, Canada (15-18 Oct. 2000)] 2000 Annual Report Conference on Electrical Insulation and Dielectric Phenomena (Cat. No.00CH37132) - Comparison between photo-, cathodo-, and electro-luminescence spectra of polyethylene naphthalate films and relationship with electrical aging

Teyssedre, G., Laurent, C., Jonnard, P., Bonnelle, C.

Year:

2000

Language:

english

File:

PDF, 406 KB

english, 2000

22

On the Kramers–Kronig transform with logarithmic kernel for the reflection phase in the Drude model

André, Jean-Michel, Le Guen, Karine, Jonnard, Philippe, Mahne, Nicola, Giglia, Angelo, Nannarone, Stefano

Journal:

Journal of Modern Optics

Year:

2010

Language:

english

File:

PDF, 394 KB

english, 2010

23

Radiative Decay of Al 1 s Core Hole in Monocrystalline AlAs

Vergand, F, Jonnard, P, Bonnelle, C

Journal:

EPL (Europhysics Letters)

Year:

1989

Language:

english

File:

PDF, 606 KB

english, 1989

24

Local electronic distribution on Al sites at GaAs/AlAs interface

P. Jonnard, F. Vergand, C. Bonnelle, C. Deparis, J. Massies

Year:

1991

Language:

english

File:

PDF, 316 KB

english, 1991

25

Design, development and applications of etched multilayers for soft X-ray spectroscopy

Le Guen, Karine, Benbalagh, Rabah, André, Jean-Michel, Coudevylle, Jean-René, Jonnard, Philippe

Journal:

The European Physical Journal Applied Physics

Year:

2017

Language:

english

File:

PDF, 2.69 MB

english, 2017

26

Characterization of Pd/Y multilayers with B 4 C barrier layers using GIXR and X-ray standing wave enhanced HAXPES

Wu, M.-Y., Huang, Q.-S., Le Guen, K., Ilakovac, V., Li, B.-X., Wang, Z.-S., Giglia, A., Rueff, J.-P., Jonnard, P.

Journal:

Journal of Synchrotron Radiation

Year:

2018

Language:

english

File:

PDF, 1.36 MB

english, 2018

27

Impact of KF-post deposition treatment on Cu(In,Ga)Se2 surface and Cu(In,Ga)Se2/CdS interface sulfurization

Harel, S., Jonnard, P., Lepetit, T., Arzel, L., Barreau, N.

Journal:

Applied Surface Science

Year:

2019

Language:

english

File:

PDF, 541 KB

english, 2019

28

Concentration of an alfalfa growth factor for neurospora sitophila and its use in the microbiological assay of pyridoxine

Arthur F. Novak, Mary Lou Jonnard, Joseph A. Liuzzo

Journal:

Journal of Pharmaceutical Sciences

Year:

1958

Language:

english

File:

PDF, 372 KB

english, 1958

29

High-resolution x-ray analysis with multilayer gratings

P. Jonnard, K. Le Guen, J.-M. André

Journal:

X-Ray Spectrometry

Year:

2009

Language:

english

File:

PDF, 128 KB

english, 2009

30

Thermal stability of Mg/Co multilayer with B_4C, Mo or Zr diffusion barrier layers

Zhu, Jingtao, Zhou, Sika, Li, Haochuan, Wang, Zhanshan, Jonnard, Philippe, Le Guen, Karine, Hu, Min-Hui, André, Jean-Michel, Zhou, Hongjun, Huo, Tonglin

Journal:

Year:

2011

Language:

english

File:

PDF, 1.13 MB

english, 2011

31

Feasibility considerations of a soft-x-ray distributed feedback laser pumped by an x-ray free electron laser

André, Jean-Michel, Le Guen, Karine, Jonnard, Philippe

Journal:

Year:

2014

Language:

english

File:

PDF, 812 KB

english, 2014

32

Comparison of Cu-MgO Interfaces Studied by EXES and XPS

Jonnard, P., Hombourger, C., Vergand, F., Bonnelle, C., Ealet, B., Renou, A., Gillet, E.

Journal:

Surface Review and Letters

Year:

1998

Language:

english

File:

PDF, 307 KB

english, 1998

33

The nature of the pressor and depressor factors derived from the kidney

Raymond Jonnard, Marvin R. Thompson

Journal:

Journal of Pharmaceutical Sciences

Year:

1943

Language:

english

File:

PDF, 1.66 MB

english, 1943

34

Optical and structural performance of the Al(1%wtSi)/Zr reflection multilayers in the 17–19nm region

Zhong, Qi, Li, Wenbin, Zhang, Zhong, Zhu, Jingtao, Huang, Qiushi, Li, Haochuan, Wang, Zhanshan, Jonnard, Philippe, Le Guen, Karine, André, Jean-Michel, Zhou, Hongjun, Huo, Tonglin

Journal:

Year:

2012

Language:

english

File:

PDF, 1.60 MB

english, 2012

35

SPIE Proceedings [SPIE SPIE Europe Optics + Optoelectronics - Prague, Czech Republic (Monday 20 April 2009)] EUV and X-Ray Optics: Synergy between Laboratory and Space - Optical, chemical, and depth characterization of Al/SiC periodic multilayers

Jonnard, P., Le Guen, K., Hu, M.-H., André, J.-M., Meltchakov, E., Hecquet, C., Delmotte, F., Galtayries, A., Hudec, René, Pina, Ladislav

Year:

2009

Language:

english

File:

PDF, 249 KB

english, 2009

36

High reflectance Cr/V multilayer with B_4C barrier layer for water window wavelength region

Huang, Qiushi, Fei, Jiani, Liu, Yang, Li, Pin, Wen, Mingwu, Xie, Chun, Jonnard, Philippe, Giglia, Angelo, Zhang, Zhong, Wang, Kun, Wang, Zhanshan

Journal:

Year:

2016

Language:

english

File:

PDF, 1.64 MB

english, 2016

37

CORRESPONDENCE AND RESPONSE; Determination of Total Nitrogen

Beet, A.E., Belcher, R., Godbert, A.L., Jonnard, Raymond

Journal:

Industrial & Engineering Chemistry Analytical Edition

Year:

1945

Language:

english

File:

PDF, 146 KB

english, 1945

38

Note: Observation of the angular distribution of an x-ray characteristic emission through a periodic multilayer

Jonnard, Philippe, Wu, Meiyi, André, Jean-Michel, Le Guen, Karine, Wang, Zhanshan, Huang, Qiushi, Vickridge, Ian, Schmaus, Didier, Briand, Emrick, Steydli, Sébastien, Walter, Philippe

Journal:

Review of Scientific Instruments

Year:

2018

Language:

english

File:

PDF, 427 KB

english, 2018

39

[AIP X-RAY AND INNER-SHELL PROCESSES - Rome (Italy) (24-28 June 2002)] AIP Conference Proceedings - Bragg amplification of the Si Κα line emitted from a Mo/Si multilayer irradiated by an electron beam

Year:

2003

File:

PDF, 504 KB

2003

40

Characterization of the chemical composition of uranium microparticles with irregular shapes using standardless electron probe microanalysis and micro-Raman spectrometry

essani, mouad, Brackx, Emmanuelle, Pointurier, Fabien, Berthy, Faustine, Excoffier, Emmanuel, Jonnard, Philippe

Journal:

Analytical Chemistry

Year:

2020

File:

PDF, 1.31 MB

2020

41

SOLEX: a tunable monochromatic X-ray source in the 1–20 keV energy range for metrology

C Bonnelle, P Jonnard, J.-M André, A Avila, D Laporte, H Ringuenet, M.C Lépy, J Plagnard, L Ferreux, J.C Protas

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

2004

Language:

english

File:

PDF, 416 KB

english, 2004

42

Study of the adhesion between a-CH films and TA6V substrates by electron-induced X-ray emission spectroscopy (EXES)

P. Jonnard, C. Tixier, J. Desmaison, C. Hombourger, C. Bonnelle

Journal:

Thin Solid Films

Year:

1997

Language:

english

File:

PDF, 428 KB

english, 1997

43

The thermal stability of Al(1%wtSi)/Zr EUV mirrors

Zhong, Qi, Zhang, Zhong, Zhu, Jingtao, Wang, Zhanshan, Jonnard, Philippe, Guen, Karine, Yuan, Yanyan, André, Jean-Michel, Zhou, Hongjun, Huo, Tonglin

Journal:

Applied Physics A: Materials Science & Processing

Year:

2012

Language:

english

File:

PDF, 714 KB

english, 2012

44

Electronic structure of Ni and Mo silicides investigated by x-ray emission spectroscopy and density functional theory

Jarrige, Ignace, Capron, Nathalie, Jonnard, Philippe

Journal:

Physical Review B

Year:

2009

Language:

english

File:

PDF, 375 KB

english, 2009

45

Temperature-dependent sample holder for x-ray spectrometer

Jonnard, P., Chargelègue, P., Hombourger, C., Thirion, J., Vergand, F.

Journal:

Review of Scientific Instruments

Year:

1996

Language:

english

File:

PDF, 348 KB

english, 1996

46

SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 24 April 2017)] EUV and X-ray Optics: Synergy between Laboratory and Space V - Study of Pd/Y based multilayers using high energy photoemission spectroscopy combined with x-ray standing waves

Hudec, René, Pina, Ladislav, Wu, M.-Y., Ilakovac, V., André, J.-M., Le Guen, K.,, Giglia, A., Rueff, J.-P., Huang, Q.-S., Wang, Z.-S., Jonnard, P.

Year:

2017

Language:

english

File:

PDF, 554 KB

english, 2017

47

Soft X-ray characterization of ion beam sputtered magnesium oxide (MgO) thin film

Sinha, Mangalika, Gupta, Mukul, Jonnard, Philippe, Modi, Mohammed H.

Journal:

Surface and Interface Analysis

Year:

2018

Language:

english

File:

PDF, 1.33 MB

english, 2018

48

Lamellar multilayer amplitude grating as soft-X-ray Bragg monochromator

Rabah Benbalagh, Jean-Michel André, Robert Barchewitz, Philippe Jonnard, Gwénaelle Julié, Laurent Mollard, Guy Rolland, Christian Rémond, Philippe Troussel, Rémy Marmoret, Elena O. Filatova

Journal:

Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Year:

2005

Language:

english

File:

PDF, 337 KB

english, 2005

49

X-ray Raman scattering with Bragg diffraction in a La-based superlattice

J.-M. André, P. Jonnard, C. Bonnelle, E.O. Filatova, C. Michaelsen, J. Wiesmann

Journal:

Optics Communications

Year:

2005

Language:

english

File:

PDF, 147 KB

english, 2005

50

Adhesion properties of aluminium-metallized/ammonia plasma-treated polypropylene: Spectroscopic analysis (XPS, EXES) of the aluminium/polypropylene interface

J Kurdi, H Ardelean, P Marcus, P Jonnard, F Arefi-Khonsari

Journal:

Applied Surface Science

Year:

2002

Language:

english

File:

PDF, 214 KB

english, 2002

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